IGBT Module

An engineer’s guide to IGBT module Hi-pot testing. Discover the standards, AC/DC test procedures, and critical failure analysis for ensuring insulation integrity. Learn how to diagnose issues in DBC, silicone gel, and housing to build safer, more reliable power systems.

Learn how the Under-Voltage Lockout (UVLO) in IGBT gate drivers is a critical protection circuit that prevents catastrophic failure. Discover how UVLO averts thermal runaway and destruction by ensuring the IGBT only operates with a safe, sufficient gate drive voltage.

Learn how to use Finite Element Analysis (FEA) to predict and solve thermomechanical stress in IGBT modules. This guide covers how simulation helps diagnose solder fatigue, test new materials, and optimize designs for maximum reliability and lifespan.

Master IGBT gate resistor (Rg) selection. This guide explains how to balance the critical trade-off between switching efficiency and system reliability (low EMI, voltage overshoot).

Explore why datasheet values aren’t enough for power electronics design. Learn about the Double-Pulse Test (DPT), the standard method for in-circuit characterization of IGBTs and MOSFETs. Understand how to measure switching losses (Eon, Eoff) and voltage overshoot to optimize efficiency, reliability, and EMI.

Learn how negative gate voltage boosts IGBT noise immunity to prevent spurious turn-on. This technique prevents catastrophic dV/dt-induced shoot-through and improves system reliability.

A detailed engineering comparison of copper vs. aluminum wire bonding in IGBT modules. Learn how copper’s superior material properties lead to higher efficiency, better thermal management, and a dramatic increase in power cycling reliability for high-performance applications.